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CAIRO BOOKS's Description
This book introduces and details the key facets of Combined Analysis - an
x-ray and/or neutron scattering methodology which combines structural,
textural, stress, microstructural, phase, layer, or other relevant variable or
property analyses in a single approach. The text starts with basic theories
related to diffraction by polycrystals and some of the most common combined
analysis instrumental set-ups are detailed. Also discussed are microstructures
of powder diffraction profiles; quantitative phase analysis from the Rietveld
analysis; residual stress analysis for isotropic and anisotropic materials;
specular x-ray reflectivity, and the various associated models.