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Spectroscopic Ellipsometry: Principles and Applications

Spectroscopic Ellipsometry: Principles and Applications

آخر تحديث منذ 9 أشهر

1,008 ج.م.

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آخر تحديث منذ 9 أشهر

Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and application...

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Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and application...

سعر ومواصفات Spectroscopic Ellipsometry: Principles and Applications

  • أفضل سعر لـ Spectroscopic Ellipsometry: Principles and Applications من كتب مصر فى مصر هو 1,008 ج.م.
  • طرق الدفع المتاحة هى
    دفع عند الاستلام
  • تكلفة التوصيل هى 10 ج.م., والتوصيل فى خلال 5-8 أيام
  • أول ظهور لهذا المنتج كان فى أغسطس 19, 2014

وصف كتب مصر

Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.

مميزات وعيوب Spectroscopic Ellipsometry: Principles and Applications

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