New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices (Micro and Nano Technologies) ,Ed. :1 Details

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SKU:GE810BM0JWE7XNAFAMZ
Color:original Book

Jumia's Description

New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices (Micro and Nano Technologies) ,Ed. :1 By Zeev Zalevsky - Pavel Livshits - Eran Gur - Elsevier Copyright: 2014 ISBN - 9780323241434

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