Scanning and stationary‎-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science‎,‎ the semiconductor industry‎,‎ nanotechnology and the biological‎,‎ forensic‎,‎ and medical sciences‎.‎ This book introduces current theory and practice of electron microscopy‎,‎ primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and ‎"‎inner space‎.‎‎"‎ Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students‎,‎ university teachers and researchers who need a concise reference on the basic principles of microscopy‎.‎

• Author‎:‎ R‎.‎F‎.‎ Egerton
• Publisher‎:‎ Springer
• ISBN‎:‎ 9783319398761