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سعر ومواصفات Generic The Basics of Crystallography and Diffraction

  • أفضل سعر لـ Generic The Basics of Crystallography and Diffraction by جوميا فى مصر هو 1,165 ج.م.
  • طرق الدفع المتاحة هى
    دفع عند الاستلامبطاقة ائتمانيةالدفع الاليكترونى
  • تكلفة التوصيل هى 15 ج.م., والتوصيل فى خلال 2-5 أيام
  • تباع المنتجات المماثلة لـ Generic The Basics of Crystallography and Diffraction فى جوميا, نون مع اسعار تبدأ من 612 ج.م.
  • أول ظهور لهذا المنتج كان فى فبراير 09, 2017
  • من بين المنتجات المماثلة لـ Generic The Basics of Crystallography and Diffraction أرخص سعر هو 222 ج.م. من نون

المواصفات الفنية

SKU:JU030BKAJ6LDNAFAMZ
المؤلف:Christopher Hammond
الموديل:9780198738688

منتجات مماثلة

متجر

طرق الدفع

مدة التوصيل

تكلفة التوصيل

وصف جوميا

  • Format‎:‎ Paperback
  • Number of Pages‎:‎ 544 pages
  • Dimensions‎:‎ 156 x 234 x 27mm
  • Weight‎:‎ 979.98g
  • Publication date‎:‎ 28 Jul 2015
  • Publisher‎:‎ Oxford University Press

This book provides a clear and very broadly based introduction to crystallography‎,‎ light‎,‎ X‎-ray and electron diffraction ‎- a knowledge which is essential to students in a wide range of scientific disciplines but which is otherwise generally covered in subject‎-specific and more mathematically detailed texts‎.‎ The text is also designed to appeal to the more general reader since it shows‎,‎ by historical and biographical references‎,‎ how the subject has developed from the work and insights of successive generations of crystallographers and scientists‎.‎ The book shows how an understanding of crystal structures‎,‎ both inorganic and organic may be built up from simple ideas of atomic and molecular packing‎.‎ Beginning with ‎(‎two dimensional‎)‎ examples of patterns and tilings‎,‎ the concepts of lattices‎,‎ symmetry point and space groups are developed‎.‎ ‎'‎Penrose‎'‎ tilings and quasiperiodic structures are also included‎.‎ The reciprocal lattice and its importance in understanding the geometry of light‎,‎ X‎-ray and electron diffraction patterns is explained in simple terms‎,‎ leading to Fourier analysis in diffraction‎,‎ crystal structure determination‎,‎ image formation and the diffraction‎-limited resolution in these techniques‎.‎ Practical X‎-ray and electron diffraction techniques and their applications are described‎.‎ A recurring theme is the common principles‎:‎ the techniques are not treated in isolation‎.‎ The fourth edition has been revised throughout‎,‎ and includes new sections on Fourier analysis‎,‎ Patterson maps‎,‎ direct methods‎,‎ charge flipping‎,‎ group theory in crystallography‎,‎ and a new chapter on the description of physical properties of crystals by tensors ‎(‎Chapter 14‎)‎‎.‎

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