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سعر ومواصفات Semiconductor Material and Device Characterization

  • أفضل سعر لـ Semiconductor Material and Device Characterization by جوميا فى مصر هو 1,239 ج.م.
  • طرق الدفع المتاحة هى
    دفع عند الاستلامبطاقة ائتمانيةالدفع الاليكترونى
  • تكلفة التوصيل هى 15 ج.م., والتوصيل فى خلال 2-5 أيام
  • أول ظهور لهذا المنتج كان فى إبريل 02, 2016

المواصفات الفنية

SKU:JU030BKAKB4RNAFAMZ
المؤلف:Dieter K‎.‎ Schroder
الموديل:BACCAH ‎- 9780471739067
الخامة الأساسية:Paper

وصف جوميا

  • Publisher‎:‎ John Wiley & Sons
  • Copyright‎:‎ 2006
  • Language‎:‎ English
  • ISBN13‎:‎ 9780471739067
  • Number Of Pages‎:‎ 800 pages
  • Edition‎:‎ 3
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up‎-to‎-date with the latest developments in the field and includes new pedagogical tools to assist readers‎.‎ Not only does the Third Edition set forth all the latest measurement techniques‎,‎ but it also examines new interpretations and new applications of existing techniques‎.‎ Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices‎.‎ Coverage includes the full range of electrical and optical characterization methods‎,‎ including the more specialized chemical and physical techniques‎.‎ Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition‎,‎ including‎:‎ * Updated and revised figures and examples reflecting the most current data and information *260 new references offering access to the latest research and discussions in specialized topics * New problems and review questions at the end of each chapter to test readers‎'‎ understanding of the material In addition‎,‎ readers will find fully updated and revised sections in each chapter‎.‎ Plus‎,‎ two new chapters have been added‎:‎ * Charge‎-Based and Probe Characterization introduces charge‎-based measurement and Kelvin probes‎.‎ This chapter also examines probe‎-based measurements‎,‎ including scanning capacitance‎,‎ scanning Kelvin force‎,‎ scanning spreading resistance‎,‎ and ballistic electron emission microscopy‎.‎ * Reliability and Failure Analysis examines failure times and distribution functions‎,‎ and discusses electromigration‎,‎ hot carriers‎,‎ gate oxide integrity‎,‎ negative bias temperature instability‎,‎ stress‎-induced leakage current‎,‎ and electrostatic discharge‎.‎ Written by an internationally recognized authority in the field‎,‎ Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials‎.‎ An Instructor‎'‎s Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department‎.‎

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